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- Data for X-Ray Analysis: Vol. I, by W. Parrish and B. W. Irwin. Mount Vernon, N. Y.: Philips Technical Library, Research and Control Instruments Division, North American Philips Co., Inc. 100 pages. $2.00 Vol. II, by W. Parrish, M. G. Ekstein and B. W. Irwin. 84 pages. $2.00
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